NXP JCOP 7.x with eUICC extension on SN300 B1.1 Secure Element
NXP Semiconductors Netherlands N.V. - EUCC 2500052
Key facts
- Scheme
- EUCC
- Certificate
- 2500052
- Standard
- EUCC (Common Criteria)
- Assurance level
- EAL4
- Status
- active
- Manufacturer
- NXP Semiconductors Netherlands N.V.
- Category
- SMARTCARDS AND SIMILAR DEVICES
- Certified
- August 19, 2025
- Valid until
- August 19, 2030
- Versions
- 1.1
Algorithms
- 3DES
- AES
- CBC-MAC
- DES
- ECC
- ECDH
- ECDSA
- EdDSA
- HMAC
- SEED
- SHA-1
- SHA-224
- SHA-256
- SHA-384
- SHA-512
- Triple-DES
Algorithms named in the security target and certification report.
Assurance requirements
- ADV_ARC.1
- ADV_FSP.4
- ADV_IMP.1
- ADV_TDS.3
- AGD_OPE.1
- AGD_PRE.1
- ALC_CMC.4
- ALC_CMS.4
- ALC_DEL.1
- ALC_DVS.2
- ALC_FLR.2
- ALC_LCD.1
- ALC_TAT.1
- ASE_CCL.1
- ASE_ECD.1
- ASE_INT.1
- ASE_OBJ.2
- ASE_SPD.1
- ATE_COV.2
- ATE_DPT.1
- ATE_FUN.1
- ATE_IND.2
- AVA_VAN.5
Security assurance requirements (SARs) found in the certificate documents, e.g. AVA_VAN.5 for vulnerability analysis against high attack potential. See Common Criteria EAL levels explained.
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP, the Common Criteria Portal and ENISA (EUCC) - dataset of September 22, 2026 - synced October 17, 2026
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