MF0AES(H)x0, NT2H2xy1G and NT2H2xy1S, release B0
NXP Semiconductors Germany GmbH - EUCC EUCC-3100-2026-7001701
Key facts
- Scheme
- EUCC
- Certificate
- EUCC-3100-2026-7001701
- Standard
- EUCC (Common Criteria)
- Assurance level
- EAL3
- Status
- active
- Manufacturer
- NXP Semiconductors Germany GmbH
- Category
- SMARTCARDS AND SIMILAR DEVICES
- Certification scheme
- NL
- Certified
- August 25, 2026
- Valid until
- August 25, 2031
- Versions
- -
Algorithms
- AES
- CMAC
- ECC
Algorithms named in the security target and certification report.
Assurance requirements
- ADV_ARC.1
- ADV_FSP.3
- ADV_TDS.2
- AGD_OPE.1
- AGD_PRE.1
- ALC_CMC.3
- ALC_CMS.3
- ALC_DEL.1
- ALC_DVS.1
- ALC_FLR.2
- ALC_LCD.1
- ASE_CCL.1
- ASE_ECD.1
- ASE_INT.1
- ASE_OBJ.2
- ASE_REQ.2
- ASE_SPD.1
- ASE_TSS.1
- ATE_COV.2
- ATE_DPT.1
- ATE_FUN.1
- ATE_IND.2
- AVA_VAN.2
Security assurance requirements (SARs) found in the certificate documents, e.g. AVA_VAN.5 for vulnerability analysis against high attack potential. See Common Criteria EAL levels explained.
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP, the Common Criteria Portal and ENISA (EUCC) - dataset of September 22, 2026 - synced October 17, 2026
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