ID-One ePass Full EAC v2 en configuration BAC masqué sur les composants P60x080PVC/PVG
Oberthur Technologies / NXP Semiconductors GmbH - Common Criteria ANSSI-CC-2015/65
Key facts
- Scheme
- Common Criteria
- Certificate
- ANSSI-CC-2015/65
- Standard
- Common Criteria
- Assurance level
- EAL4+, ADV_INT.2, ADV_TDS.4, ALC_CMS.5, ALC_DVS.2, ALC_TAT.2, ATE_DPT.3
- Status
- archived
- Manufacturer
- Oberthur Technologies / NXP Semiconductors GmbH
- Category
- ICs, Smart Cards and Smart Card-Related Devices and Systems
- Certification scheme
- FR
- Lab
- ###
- Certified
- November 18, 2015
- Valid until
- November 18, 2020
- Versions
- -
Algorithms
- 3DES
- AES
- CMAC
- DES
- DH
- Diffie-Hellman
- ECC
- ECDH
- ECDSA
- SHA-224
- SHA-256
- SHA-384
- SHA-512
- SHA1
- SHA256
Algorithms named in the security target and certification report.
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Certificates it builds on
- BSI-DSZ-CC-0837-V2-2014
Certificate ids found in this certificate's documents (automated extraction).
Protection profiles
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP and the Common Criteria Portal - dataset of September 10, 2026 - synced October 15, 2026
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