Smart Card IC Development flow, Smart Card IC Development section in Kumamoto, NEC - Japan
NEC Smart Card IC development Section, Kumamoto (Japan) - Common Criteria ANSSI-CC-2002/08
archivedEAL1+
Key facts
- Scheme
- Common Criteria
- Certificate
- ANSSI-CC-2002/08
- Standard
- Common Criteria
- Assurance level
- EAL1+, AVA_VLA.2
- Status
- archived
- Manufacturer
- NEC Smart Card IC development Section, Kumamoto (Japan)
- Category
- Other Devices and Systems
- Certification scheme
- FR
- Certified
- January 1, 2002
- Valid until
- September 1, 2019
- Versions
- -
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP and the Common Criteria Portal - dataset of September 10, 2026 - synced October 15, 2026
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