ChipDoc P60 on JCOP 3 SECID P60 (OSB) SSCD masqué sur composant P6022J VB
NXP Semiconductors - Common Criteria ANSSI-CC-2017/64
Key facts
- Scheme
- Common Criteria
- Certificate
- ANSSI-CC-2017/64
- Standard
- Common Criteria
- Assurance level
- EAL5+, ALC_DVS.2, AVA_VAN.5
- Status
- archived
- Manufacturer
- NXP Semiconductors
- Category
- ICs, Smart Cards and Smart Card-Related Devices and Systems
- Certification scheme
- FR
- Lab
- ##
- Certified
- November 20, 2017
- Valid until
- November 20, 2022
- Versions
- 3
Algorithms
- AES
- DES
- Diffie-Hellman
- SHA-1
- SHA-224
- SHA-256
- TDES
Algorithms named in the security target and certification report.
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Certificates it builds on
- BSI-DSZ-CC-0897-V2-2014
Certificate ids found in this certificate's documents (automated extraction).
Protection profiles
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP and the Common Criteria Portal - dataset of September 10, 2026 - synced October 15, 2026
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