P73N2M0B0.200
NXP Semiconductors - Common Criteria ANSSI-CC-2018/08
archivedEAL5+
Key facts
- Scheme
- Common Criteria
- Certificate
- ANSSI-CC-2018/08
- Standard
- Common Criteria
- Assurance level
- EAL5+, ADV_IMP.2, ADV_INT.3, ADV_TDS.5, ALC_CMC.5, ALC_DVS.2, ALC_FLR.1, ALC_TAT.3, ASE_TSS.2, ATE_COV.3, ATE_FUN.2, AVA_VAN.5
- Status
- archived
- Manufacturer
- NXP Semiconductors
- Category
- ICs, Smart Cards and Smart Card-Related Devices and Systems
- Certification scheme
- FR
- Lab
- ###
- Certified
- February 16, 2018
- Valid until
- February 16, 2023
- Versions
- 0.200
Algorithms
- AES
- DES
- ECC
- SEED
- TDEA
- TDES
- Triple-DES
- TripleDES
Algorithms named in the security target and certification report.
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP and the Common Criteria Portal - dataset of September 10, 2026 - synced October 15, 2026
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