Samsung SDS SPass V1.0
Samsung SDS - Common Criteria KECS-ISIS-0120-2008
archivedEAL4+
Key facts
- Scheme
- Common Criteria
- Certificate
- KECS-ISIS-0120-2008
- Standard
- Common Criteria
- Assurance level
- EAL4+, ADV_IMP.2, ALC_DVS.2, ATE_DPT.2, AVA_VLA.3
- Status
- archived
- Manufacturer
- Samsung SDS
- Category
- ICs, Smart Cards and Smart Card-Related Devices and Systems
- Certification scheme
- KR
- Certified
- September 24, 2008
- Valid until
- June 1, 2019
- Versions
- 1.0
Algorithms
- DES
- DH
- SEED
- SHA-1
Algorithms named in the security target and certification report.
CVEs that may affect this product
sec-certs has not matched any CVE to this certificate. That is not proof the product is unaffected.
Related CVEs and certificate references are automated matches by sec-certs, not reviewed by humans: treat them as "may be affected" and verify before acting.
Documents and sources
Source: sec-certs.org (CRoCS, Masaryk University), from NIST CMVP and the Common Criteria Portal - dataset of September 10, 2026 - synced October 15, 2026
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